A well-staffed Materials Characterization Facility (MCF) serves TcSUH laboratories and research groups with expertise in electron microanalysis, measurement of materials microstructures, and high pressure-high temperature synthesis. MCF equipment and capabilities include a JEOL 2000 FX transmission electron microscope, a JEOL 2010SFX scanning transmission electron microscope, a JEOL JXA-8600 electron microprobe, a JEOL JSM 6330F Scanning electron microscope, a JEOL JSM-5410 scanning electron microscope, a electron microprobe, a Seimens D5000 X-ray diffractometer, a Seimens GADDS X-ray diffractometer, a Netzsch 402C Dilatometer, and additional analytical support from stand-alone high-temperature phase equilibria and x-ray diffraction laboratories.

(J. Meen, jmeen@uh.edu)

Links:

- Materials Characterization Facility website

- Download a list (PDF) of the 2007 MCF equipment available to TcSUH, UH and other university researchers, and industry partners

- Find out about our other facilities